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Pilot · unverifiedCapability Asset

LET (Laser & Etching Technology) for TGV Glass Substrate Processing

Proprietary picosecond laser + wet etching process for forming TGV through-holes in glass substrates, achieving aspect ratios up to 9:1, positional accuracy ±10μm, and supporting straight, hourglass, and tapered via profiles for 2.5D/3D packaging and glass interposer applications.

AI-assisted directory summary. Technical specifications, performance metrics, readiness and compliance labels are unverified unless individually supported and reviewed. Proposed partnership routes do not establish supplier consent, export eligibility, or willingness to sign an NDA. Confirm claims and test conditions with the linked sources and supplier before procurement or citation.

Problem solved

The difficulty of forming high-quality, crack-free TGV micro-vias in glass substrates for advanced semiconductor packaging, particularly the trade-off between positional accuracy, via profile control, and substrate damage.

Application contexts

  • Glass interposers for 2.5D/3D chiplet packaging
  • Semiconductor manufacturing equipment insulating parts (gas shower plates)
  • Microfluidic devices with glass through-holes
  • RF/microwave modules requiring low-loss glass substrates

Technical principle

A picosecond laser beam creates modified regions within the glass volume along the intended via path. The modified glass etches preferentially in a subsequent wet chemical bath, forming a through-hole. The laser modification pattern and etching parameters control the via profile (straight, hourglass, or tapered). The process works on multiple glass types (alkali-free, quartz, borosilicate, soda-lime) without inducing microcracks.

Typical use cases

  • TGV via array formation for glass interposer in chiplet-based AI processors
  • Fine-pitch vertical interconnect for 2.5D glass-core substrate prototypes
  • Glass insulating components with shaped through-holes for semiconductor etch/CVD equipment

Partnership route

How global engineering teams typically engage this asset.

01Technical Interview
02Nda
03Feasibility Review
04Prototype
05Pilot Production

Helpful to include: Maximum TGV via density achievable on 370×470mm panel · Via wall roughness (Ra/Rz) and its impact on Cu plating adhesion · Current positional accuracy Cpk data · Processing time per panel and estimated cost for pilot quantities

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Provider

Source & provenance

Translation review status: unreviewed. Publication does not establish technical verification or supplier endorsement.

Original language: JA.

Record updated: .

Collector timestamps record when a source was stored, not an independent verification date. Source links provide context; they do not validate every specification, readiness label, certification, or proposed partnership route.